Scanning Electron Microscopy: Basic Function

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4.8 (1,696 évaluations)
  • 5 stars
    82.07%
  • 4 stars
    16.21%
  • 3 stars
    1.29%
  • 2 stars
    0.29%
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MS

Dec 02, 2019

This course was very helpful to understand the basic fabrication techniques for making micro and nanodevices. I can confidently use equipment in my laboratory after doing this course. Thank you

AS

Aug 23, 2020

Hello everyone,\n\nI want to thank you all for giving me the opportunity to learn about nanotechnology from the best. The course was very interesting and I really enjoy it. Thank you very much!

À partir de la leçon
Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

Enseigné par

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    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
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    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
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    James Cahoon

    Assistant Professor
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    Jacob Jones

    Professor

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