XPS: Quantitative Analysis, Depth Profiling

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4.8 (81 évaluations)
  • 5 stars
    79.01%
  • 4 stars
    17.28%
  • 3 stars
    3.70%
KR

Apr 08, 2020

I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

CL

Jul 11, 2020

As a researcher, this course helped a lot in identifying which surface analysis should be appropriately used.

À partir de la leçon
X-ray Diagnostics

Enseigné par

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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