SIMS: Basic Principles and Components

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4.8 (113 évaluations)
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AS
18 mai 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

CA
9 nov. 2020

Excellent course that provides a lot of information about the most important characterization tools for materials.

À partir de la leçon
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Enseigné par

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    Sadovsky Yaroslav

    Assistant

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