SIMS: Basic Principles and Components

Loading...
Visualiser le programme de cours

Avis

4.8 (11 notes)
  • 5 stars
    9 ratings
  • 4 stars
    2 ratings
À partir de la leçon
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Enseigné par

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

Explorer notre catalogue

Rejoignez-nous gratuitement et obtenez des recommendations, des mises à jour et des offres personnalisées.